An ASIC for the measurement of low frequency noise in MOS transistors

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Cyclostationary (switched) operation of the MOS transistor has been proposed in recent years as a technique for reducing the flicker noise at the device level itself. Nevertheless accurate noise measurements covering a wide range of operation regions for the transistor are still required to support the proposed cyclostationary noise models. In this work, several noise measurement issues are discussed, and the development of an integrated circuit aimed at switched flicker noise measurements in different types/sizes of test transistors and at different bias conditions is presented. The proposed ASIC is a matrix of differential pairs (DUTs) connected to a GmC chopper-Amplifier. The chopper modulators are disposed to amplify flicker noise from the DUTs while the remaining flicker noise sources in the circuit are cancelled.

Original languageEnglish
Title of host publication2014 IEEE International Instrumentation and Measurement Technology Conference
Subtitle of host publicationInstrumentation and Measurement for Sustainable Development, I2MTC 2014 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages812-815
Number of pages4
ISBN (Print)9781467363853
DOIs
StatePublished - 2014
Event2014 IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Sustainable Development, I2MTC 2014 - Montevideo, Uruguay
Duration: 12 May 201415 May 2014

Publication series

NameConference Record - IEEE Instrumentation and Measurement Technology Conference
ISSN (Print)1091-5281

Conference

Conference2014 IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Sustainable Development, I2MTC 2014
Country/TerritoryUruguay
CityMontevideo
Period12/05/1415/05/14

Keywords

  • MOSFET
  • flicker noise
  • noise measurement

Fingerprint

Dive into the research topics of 'An ASIC for the measurement of low frequency noise in MOS transistors'. Together they form a unique fingerprint.

Cite this