Analysis of the low-frequency noise in graded-channel and standard SOI nMOSFET
- E. L.R. Da Silva
- , Matías Rafael Miguez de Mori
- , M. De Souza
- , Alfredo Arnaud Maceira
- , M. A. Pavanello
- Centro Universitário da FEI
Research output: Contribution to journal › Article › peer-review
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