Bulk linearization techniques

Alfredo Arnaud, Rafael Puyol, Denisse Hardy, Matías Miguez, Joel Gak

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Scopus citations

Abstract

The use of the bulk terminal to enhance the linear properties of the MOS transistor is examined. Firstly, bulk-linearization of a MOS differential pair is presented, including harmonic distortion measurements. Then bulk-degeneration technique is extended to the triode region to implement large MOS pseudo-resistors. A new asymmetric bulk-modified composite MOS with an equivalent saturation voltage of several hundred mV is introduced, and a 150MΩ pseudo-resistor by stacking a few of these stages is presented. Finally, bulk-linearization of the MOS differential pair and the MOS resistor are combined to implement a 6.4nS transconductor with above 1V linear range, consuming only 6nA, improving the compromise between linear range and power consumption of previously reported small transconductance OTAs.

Original languageEnglish
Title of host publication2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728103976
DOIs
StatePublished - 2019
Event2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Sapporo, Japan
Duration: 26 May 201929 May 2019

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume2019-May
ISSN (Print)0271-4310

Conference

Conference2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019
Country/TerritoryJapan
CitySapporo
Period26/05/1929/05/19

Keywords

  • Bulk-degeneration
  • CMOS transistor
  • Linearization

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