Consistent model for drain current mismatch in MOSFETs using the carrier number fluctuation theory
- H. Klimach
- , A. Arnaud
- , M. C. Schneider
- , C. Galup-Montoro
- Federal University of Santa Catarina
- Universidade Federal do Rio Grande do Sul
- Universidad de la República
Research output: Contribution to journal › Conference article › peer-review
9
Scopus
citations