TY - GEN
T1 - A complete compact model for flicker noise in MOS transistors
AU - Arnaud, Alfredo
AU - Hoffmann, Alain
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/9/9
Y1 - 2015/9/9
N2 - In this work, a consistent, physics-based, one-equation-all-regions model for flicker noise in MOS transistors that consider both mobility and carrier number fluctuations is presented. The final result resembles the known BSIM flicker noise model but some inconsistencies are avoided because approximations and interpolation are not necessary. A exact noise integration along the channel was possible with the aid of a one-equation-all-regions dc model of the MOS transistor. Finally, a brief discussion is presented about which of the terms of the new model are necessary for the designer, that require accurate but simple equations for the design space exploration.
AB - In this work, a consistent, physics-based, one-equation-all-regions model for flicker noise in MOS transistors that consider both mobility and carrier number fluctuations is presented. The final result resembles the known BSIM flicker noise model but some inconsistencies are avoided because approximations and interpolation are not necessary. A exact noise integration along the channel was possible with the aid of a one-equation-all-regions dc model of the MOS transistor. Finally, a brief discussion is presented about which of the terms of the new model are necessary for the designer, that require accurate but simple equations for the design space exploration.
UR - http://www.scopus.com/inward/record.url?scp=84945161526&partnerID=8YFLogxK
U2 - 10.1109/LASCAS.2015.7250496
DO - 10.1109/LASCAS.2015.7250496
M3 - Contribución a la conferencia
AN - SCOPUS:84945161526
T3 - 2015 IEEE 6th Latin American Symposium on Circuits and Systems, LASCAS 2015 - Conference Proceedings
BT - 2015 IEEE 6th Latin American Symposium on Circuits and Systems, LASCAS 2015 - Conference Proceedings
A2 - Arnaud, Alfredo
A2 - Silveira, Fernando
A2 - Garcia, Lorena
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 6th IEEE Latin American Symposium on Circuits and Systems, LASCAS 2015
Y2 - 24 February 2015 through 27 February 2015
ER -