An ASIC for the measurement of low frequency noise in MOS transistors

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Resumen

Cyclostationary (switched) operation of the MOS transistor has been proposed in recent years as a technique for reducing the flicker noise at the device level itself. Nevertheless accurate noise measurements covering a wide range of operation regions for the transistor are still required to support the proposed cyclostationary noise models. In this work, several noise measurement issues are discussed, and the development of an integrated circuit aimed at switched flicker noise measurements in different types/sizes of test transistors and at different bias conditions is presented. The proposed ASIC is a matrix of differential pairs (DUTs) connected to a GmC chopper-Amplifier. The chopper modulators are disposed to amplify flicker noise from the DUTs while the remaining flicker noise sources in the circuit are cancelled.

Idioma originalInglés
Título de la publicación alojada2014 IEEE International Instrumentation and Measurement Technology Conference
Subtítulo de la publicación alojadaInstrumentation and Measurement for Sustainable Development, I2MTC 2014 - Proceedings
EditorialInstitute of Electrical and Electronics Engineers Inc.
Páginas812-815
Número de páginas4
ISBN (versión impresa)9781467363853
DOI
EstadoPublicada - 2014
Evento2014 IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Sustainable Development, I2MTC 2014 - Montevideo
Duración: 12 may. 201415 may. 2014

Serie de la publicación

NombreConference Record - IEEE Instrumentation and Measurement Technology Conference
ISSN (versión impresa)1091-5281

Conferencia

Conferencia2014 IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Sustainable Development, I2MTC 2014
País/TerritorioUruguay
CiudadMontevideo
Período12/05/1415/05/14

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