Resumen
Handling component mismatch represents a great challenge in analog and even digital design for current and future submicron technologies. This article, a special selection from the Symposium on Integrated Circuits and Systems Design (SBCCI), presents a matching model to help designers account for real effects while maintaining simplicity and easing the design effort.
Idioma original | Inglés |
---|---|
Páginas (desde-hasta) | 20-29 |
Número de páginas | 10 |
Publicación | IEEE Design and Test of Computers |
Volumen | 23 |
N.º | 1 |
DOI | |
Estado | Publicada - ene. 2006 |
Publicado de forma externa | Sí |