MOSFET mismatch modeling: A new approach

Hamilton Klimach; Carlos Galup-Montoro; Márcio C. Schneider; Alfredo Arnaud

doi:10.1109/MDT.2006.20

MOSFET mismatch modeling: A new approach

Hamilton Klimach, Carlos Galup-Montoro, Márcio C. Schneider, Alfredo Arnaud

Producción científica: Contribución a una revista › Artículo › revisión exhaustiva

17 Citas (Scopus)

Resumen

Handling component mismatch represents a great challenge in analog and even digital design for current and future submicron technologies. This article, a special selection from the Symposium on Integrated Circuits and Systems Design (SBCCI), presents a matching model to help designers account for real effects while maintaining simplicity and easing the design effort.

Idioma original	Inglés
Páginas (desde-hasta)	20-29
Número de páginas	10
Publicación	IEEE Design and Test of Computers
Volumen	23
N.º	1
DOI	https://doi.org/10.1109/MDT.2006.20
Estado	Publicada - ene. 2006
Publicado de forma externa	Sí

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abstract = "Handling component mismatch represents a great challenge in analog and even digital design for current and future submicron technologies. This article, a special selection from the Symposium on Integrated Circuits and Systems Design (SBCCI), presents a matching model to help designers account for real effects while maintaining simplicity and easing the design effort.",

author = "Hamilton Klimach and Carlos Galup-Montoro and Schneider, \{M{\'a}rcio C.\} and Alfredo Arnaud",

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AB - Handling component mismatch represents a great challenge in analog and even digital design for current and future submicron technologies. This article, a special selection from the Symposium on Integrated Circuits and Systems Design (SBCCI), presents a matching model to help designers account for real effects while maintaining simplicity and easing the design effort.

UR - https://www.scopus.com/pages/publications/32144438124

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DO - 10.1109/MDT.2006.20

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MOSFET mismatch modeling: A new approach

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